surface morphology 表面形貌分析 Optical profiler,SEM,TEM 分析对象: FPC 柔性线路板 Gold finger金手指 Gold bump 金凸块 ITO 薄膜分析 SEM/EDS, TEM/EDS Organic Dots and Contamination Analysis**污染分析 FTIR Structure defects 结构缺陷分析 TEM,SEM 分析对象: COG bonding,Gold Bump,Gold finger Bright /dark dots and bright/dark lines 亮点/暗点,亮线/暗线 Failure Analysis 失效分析 EMMI,SAM,FIB,TEM,SEM 分析对象: Driver IC,Gold Bump,ITO,Gold Finger… …